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High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
| Best Sellers Rank | #5,593,590 in Books ( See Top 100 in Books ) #483 in Crystallography Chemistry (Books) #603 in Nanostructures in Physics #763 in Physics of Light (Books) |
| Customer Reviews | 4.0 out of 5 stars 1 Review |
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